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Dynamic Multi-Criteria Bottleneck Severity Index (DMBSI) for Semiconductor Wafer Manufacturing: A Genetically Optimised Framework for Reentrant Production Systems
arXiv – CS AI|Mohammad Sharifur Rahman, Karl McCreadie, Saugat Bhattacharyya, M M Manjurul Islam, Cormac McAteer, Bryan John Baker, Nuala Parker, Girijesh Prasad|
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