AINeutralarXiv – CS AI · 15h ago6/10
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Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
Researchers propose an unsupervised anomaly detection framework using Diffusion Transformers to identify defects in semiconductor manufacturing at the 16nm node. The method combines autoencoders with diffusion models to screen for rare defects without labeled training data, achieving state-of-the-art results on industrial test data.