AIBullisharXiv – CS AI · 6h ago6/10
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Overcoming Labelled Data Scarcity for Defect Classification in Scanning Tunneling Microscopy
Researchers have developed an automated approach to segmentation of scanning tunneling microscopy (STM) images using few-shot and unsupervised learning, eliminating the need for large manually annotated datasets. The technique successfully identifies atomic features across multiple surfaces with strong generalization capabilities, requiring only one additional labeled data point to adapt to new materials.